On-Line Webinar Schedule | EMC Troubleshooting | Prof. Arturo Mediano

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Greece – 29th January 2021

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India – 2nd February 2021

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Norway – 17nd February 2021

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 Italy – 23rd March 2021

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2nd On-Line Webinar Schedule | Analyzing Electronic Products with Near Field Scanning Technology 

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 US – 27th January 2021

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Russia – 16th February 2021

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Austria – 24th February 2021

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NEW Technical Note:

With Near Field Scanners you will discover a new and powerful way to “see” EMI!

Arturo Mediano – July, 2020
Y.I.C. Technical Advisor · Professor University of Zaragoza

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On-Demand Webinars.

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The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away