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On-Line Webinar Schedule |  Prof. Arturo Mediano

Please select your region and register to join the upcoming webinar:

 

22nd September – Secrets of Near & Far Field Scanning – India – 10 am GMT

Register Here:

29th September – Secrets of Near & Far Field Scanning – UK – 11.30 am GMT

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 27th October – Analyasing Electronic Products with Near Field Scanning – APAC Region – 9 am GMT

Registration opening soon

1st December – Join this live Q&A session with Prof. Arturo Mediano who will answer all your EMC challenging questions – EMEA Region – 3pm GMT

Registration opening soon

3rd December – Join this live Q&A session with Prof. Arturo Mediano who will answer all your EMC challenging questions – APAC Region – 9 am GMT

Registration opening soon

14th December – Join this live Q&A session with Prof. Arturo Mediano who will answer all your EMC challenging questions – USA Region – 3pm GMT

Registration opening soon

Upcoming events to visit & see a live demonstration with our units

 

5 – 8 October 2021 – PCB West – California – US

Visit Website

19 – 20 October – Engineering Design Show – UK

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 23 October – AMTA – Florida – US

Visit Website

1 – 3 November – IEEE COMCAS – Israel

Visit Website

9 November – EIF – Norway

24 November – NewTech – Israel

 

 

Application Note: 

How EMScanner Diagnoses Board-Level EMC Design Issues
Issued in May 2021

Download Here:

8 Hints For Better Spectrum Analyzer Measurements

View Here:

Technical Document:

With Near Field Scanners you will discover a new and powerful way to “see” EMI!

Arturo Mediano – July, 2020
Y.I.C. Technical Advisor · Professor University of Zaragoza

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Press Releases:

Y.I.C. Technologies & Trilogy-Net Distribution Agreement

February 2021

Read More

Want to know more?  Please get in touch!

support@yictechnologies.com

On-Demand Webinars.

Please fill in your details below to view our EMC/EMI Troubleshooting Webinar presented by Professor Arturo Mediano

SCANNER USERS

Testimonials

The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away