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On-Line Webinar Schedule | EMC Troubleshooting | Prof. Arturo Mediano

Please select your region and register to join the upcoming webinar:

Netherlands – 24th November 2020

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Czech Republic – 16th December 2020

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Greece – 29th January 2021

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2nd On-Line Webinar Schedule | Analyzing Electronic Products with Near Field Scanning Technology 

Please select your region and register to join the upcoming webinar:

Singapore – 10th December 2020

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US – 27th January 2021

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NEW Technical Note:

With Near Field Scanners you will discover a new and powerful way to “see” EMI!


Arturo Mediano – July, 2020
Y.I.C. Technical Advisor · Professor University of Zaragoza

Want to know more?  Please get in touch!

support@yictechnologies.com

On-Demand Webinars.

Please fill in your details below to view our EMC/EMI Troubleshooting Webinar presented by Professor Arturo Mediano

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SCANNER USERS

Testimonials

The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away

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