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On-Line Webinar Schedule | EMC Troubleshooting | Prof. Arturo Mediano
Please select your region and register to join the upcoming webinar:
Netherlands – 24th November 2020
Czech Republic – 16th December 2020
Greece – 29th January 2021
2nd On-Line Webinar Schedule | Analyzing Electronic Products with Near Field Scanning Technology
Please select your region and register to join the upcoming webinar:
Singapore – 10th December 2020
US – 27th January 2021
NEW Technical Note:
With Near Field Scanners you will discover a new and powerful way to “see” EMI!
Arturo Mediano – July, 2020
Y.I.C. Technical Advisor · Professor University of Zaragoza
Want to know more? Please get in touch!
support@yictechnologies.com
On-Demand Webinars.
Please fill in your details below to view our EMC/EMI Troubleshooting Webinar presented by Professor Arturo Mediano
SCANNER USERS
Testimonials
The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away