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On-Line Webinar Schedule | Prof. Arturo Mediano
Please select your region and register to join the upcoming webinar:
26th May 2021 – Secrets of Near and Far Field Scanning – Austria
1st June 2021 – EMC Troubleshooting – US
8th June 2021 – Secrets of Near and Far Field Scanning – Germany
9th June 2021 – Analyzing Electronic Products with Near Field Scanning – Norway
16th June 2021 – Analyzing Electronic Producsts with Near Field Scanning – India
30th June 2021 – EMC Troubleshooting – United Kingdom
14th September 2021 – Secrets of Near and Far Field Scanning – Russia
Register Here:
Technical Notes:
Application Note:
How EMScanner Diagnoses Board-Level EMC Design Issues
Issued in May 2021
Technical Document:
With Near Field Scanners you will discover a new and powerful way to “see” EMI!
Arturo Mediano – July, 2020
Y.I.C. Technical Advisor · Professor University of Zaragoza
Want to know more? Please get in touch!
support@yictechnologies.com
On-Demand Webinars.
Please fill in your details below to view our EMC/EMI Troubleshooting Webinar presented by Professor Arturo Mediano
SCANNER USERS
Testimonials
The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away