NFP Set
H&E-Near Field Probe Set is designed for measuring near field emissions for EMC/EMI Troubleshooting and Pre-Compliance testing.
NFP H-Field Probe Set designed by Y.I.C. Technologies is designed for measuring near field emissions for EMC/EMI Troubleshooting and Pre-Compliance testing.
NFPH10A
Low Frequency 10MHz-350MHz
NFPH20A
MID Range 175MHz – 3GHz
NFPH30A
HIGH Range 3GHz – 18GHz
These probes is used to locate, identify, measure, and characterize potential sources of electromagnetic radiation. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.
Purchase Your Set and Kit here:
Please click on the solution you would like to purchase:
Ideal PCB projects for EMScanner are boards designed for high speed, high power, and/or high density/complexity. Any PCB that places a premium on board real-estate also qualifies as an excellent candidate. The compact, flat scanner provides PCB design teams with an easy-to-use, costeffective, and proven tabletop solution. Emission, immunity, filtering, EMI shielding, broadband noise and Common Mode testing are some of the applications that the EMScanner system addresses in mere seconds.
Keysight Solution Partners
Y.I.C. Technologies products are compatible with most mainstream Spectrum Analyzers. However, if you with to purchase a Spectrum Analyzer, please get in touch. support@yictechnologies.com
RESOURCES
To view and/or download EMScanner resources, simply click on the links below:
Product Features
- Fully integrated with Y.I.C. Technologies EMViewer software and EMProbe
- Normalization and correction when using the EMViewer software
- Flat response within the range of operation
- Slim Design and Protective Coating
- 18GHz Measured Cable included
Applications
EMC/EMI Pre-Compliance Magnetic Near-Field Measurements
- Magnetic Near Field Mapping
- Magnetic Immunity Testing
SCANNER USERS
Testimonials
The instrument provides spatial and spectral scans that allow design teams to cut one to two design cycles out of their product development process. It also reduces their EMI testing time by up to two orders of magnitude.
The design team conducted the scans on the EMxpert system in their offices. In a matter of minutes, they obtained the results. Testing the design in a third party chamber would have have been weeks away