NFP H-Field Probe Kit
Live tracking: A Rapid Handheld Probe Scanning Solution
NFP Kit designed by Y.I.C. Technologies is designed for measuring near field emissions for EMC/EMI Troubleshooting and Pre-Compliance testing.
These probes is used to locate, identify, measure, and characterize potential sources of electromagnetic radiation. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.
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Keysight Solution Partners
Y.I.C. Technologies products are compatible with most mainstream Spectrum Analyzers. However, if you with to purchase a Spectrum Analyzer, please get in touch. email@example.com
- Fully integrated with Y.I.C. Technologies EMViewer software and EMProbe
- Normalization and correction when using the EMViewer software
- Flat response within the range of operation
- Slim Design and Protective Coating
- 18GHz Measured Cable included
EMC/EMI Pre-Compliance Magnetic Near-Field Measurements
- Magnetic Near Field Mapping
- Magnetic Immunity Testing